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Welcome to the FPGA Radiation Effects & Testing Homepage

We perform Single Event Effects (SEE) testing and analysis of SRAM-FPGAs.

SRAM-based Field Programmable Gate Arrays (SRAM-FPGAs) have gained increasing consideration for space applications, e.g. Xilinx FPGAs were used in the Mars Exploration Roverís Spirit and Opportunity landers, and more recently in the Michigan Multipurpose Minisatellite (M-Cubed), and in the MISSE-8 module on the International Space Station.

satellitesIn these devices a user design is defined by configuration data stored in SRAM memory cells, allowing for dynamic reconfigurations a priori an unlimited number of times. Although SRAM-FPGAs are highly flexible, they are susceptible to Single Event Upsets (SEUs) from ionizing radiation. Circuits affected by SEUs are those embedded by a user design and also the logic governing device configuration.

From 2004 to 2007 the group was a member of the European Single Event Effect (SEE) Consortium, now Xilinx Radiation Test Consortium (XRTC). The consortium was founded in 2002 by Jet Propulsion Laboratory and Xilinx to evaluate re-configurable FPGAs for space applications.